FATEVNT
Bulk Data Entry Defines loading events for fatigue analysis.
Format
(1) | (2) | (3) | (4) | (5) | (6) | (7) | (8) | (9) | (10) |
---|---|---|---|---|---|---|---|---|---|
FATEVNT | ID | FLOAD1 | FLOAD2 | FLOAD3 | FLOAD4 | FLOAD5 | FLOAD6 | FLOAD7 | |
FLOAD8 | etc | etc | SQNTL |
Definitions
Field | Contents | SI Unit Example |
---|---|---|
ID | Each FATEVNT card
must have a unique ID. This identifier may be referenced by a FATSEQ definition. No default (Integer > 0) |
|
FLOAD# | A FATLOAD entry identification number. 1
3
No default (Integer > 0) |
|
SQNTL | Flag to switch applied
FATLOAD’s to sequential loading.
|
Comments
- FATLOAD entries referenced on this Bulk Data Entry may reference different subcases.
- Identification numbers of FATSEQ and FATEVNT share the same ID pool.
- These FATLOAD entries should reference the subcase types. For example, either static subcases or transient subcases can be referenced, but not both. Referencing a combination of subcase types via FATLOAD entries on the same FATEVNT entry is not allowed.
- Multiple Fatigue events are parallelized if SMP
parallelization is used (for example, using
-nt
run option). - SQNTL field is only supported for Static Fatigue. When SQNTL is not present, for all FATLOADs referenced in FATEVNT, the load histories from corresponding TABFATs are used to determine Stress histories for each FATLOAD and are subsequently superimposed to generate the final stress history for each fatigue event. If SQNTL flag is present, the TID field on the corresponding FATLOAD entries should be blank. Each FATLOAD now will directly be considered as a point in the final stress history.
- This card is represented as a load collector in HyperMesh.